Merlin Release History

Release Notes – Version 3.24 – 07.04.2017

New Features

[IVM-2305] – New Accesspoint View

Improvements

[IVM-2286] – Performance: Pin Number build improve so export for larger project is a lot faster
[IVM-2303] – Support rectangle with hole THD areas for automatic accespoint calculation
[IVM-2309] – CAD-Viewer: Show search result first within currently selected side
[IVM-2314] – Coverage Report: add new test table
[IVM-2315] – Coverage Report: split reports into individual html pages
[IVM-2359] – New context menu within NetView to show electrical net


Release Notes – Version 3.23 – 03.03.2017

New Features

[IVM-2159] – Parse additional exported files from Siemens importer

Improvements

[IVM-1782] – Cluster detail view
[IVM-2155] – Merlin repair: Add filter for project repair index.
[IVM-2232] – Pin-Pin-Mapping should be editable in Library-Mapping
[IVM-2289] – Remove gate error from „Select library device for mapping“ dialog
[IVM-2307] – Overall performance improvements for Merlin
[IVM-2316] – Merlin Repair: support several xml versions


Release Notes – Version 3.21 – 18.10.2016

New Features

[IVM-552] – Logging Level configuration in new preferences dialog

Improvements

[IVM-2081] – Reverse measurement for IC´s
[IVM-2100] – Handle devices without coordinates.
[IVM-2185] – Updated Siemens-Importer for Zuken and ODB


Release Notes – Version 3.20 – 12.09.2016

New Features

[IVM-1752] – Link devices between different views
[IVM-1931] – NO and NC as new GateSubType for Relay

Improvements

[IVM-2060] – Allow selection of exporter when export is triggered by task view and multiple exporters are available
[IVM-2115] – Search for device in Cluster View
[IVM-2138] – Improve performance for opening Test Result View


Release Notes – Version 3.19 – 28.07.2016

New Features

[IVM-2022] – Link ATD und XML files to merlin project

Improvements

[IVM-1781] – New group element to see all electrical net
[IVM-1828] – Change startmenu entry
[IVM-1830] – It should be possible to edit description and condition after test template has been created again
[IVM-1840] – Repair: Access net shares for collecting / storing files
[IVM-1936] – Library Mapping wrong initial state for known library entry
[IVM-1965] – Device View: Improve default NetLink pin Connections
[IVM-1981] – Disable merlin repair merlin explorer functions
[IVM-1995] – Repair: Arrow left and right shortcut for step actions
[IVM-2006] – Better calculation of access points on pads
[IVM-2011] – Probe Permissions on bottom improved
[IVM-2015] – Sync should only be active if project data are present
[IVM-2020] – Repair: Improve net distances algorithm for close net
[IVM-2056] – Possible needle calculation: mirroring should be taken into account


Release Notes – Version 3.18 – 27.06.2016

New Features

[IVM-1923] – Resize bounding box with a single mouse move action
[IVM-1947] – Repair: Show Open Test problems with a simple red circle
[IVM-1976] – Repair: Judgement filter list

Improvements

[IVM-1744] – FETGeneration and TransistorGenerationTest are supporting jumped flag
[IVM-1868] – Repair: Show test comment within repair view
[IVM-1871] – Merlin repair and Merlin pro blocks projects for the other programm
[IVM-1873] – Repair: Improve serial number search
[IVM-1973] – Repair: Closing repair view will close project
[IVM-1975] – Repair: Auto highlight net for each test switch
[IVM-1979] – Repair: Only show pin lables used for the current test
[IVM-2009] – Net Distance Calculation: save all net distances < 1,5mm and not < 0,5mm


Release Notes – Version 3.17 – 23.05.2016

New Features

[IVM-1925] – Takaya 9600 flying probe tester support (double side export)
[IVM-1958] – Added Cluster Tests to estimated coverage report

Improvements

[IVM-1167] – Use keyword „yes“ instead of „x“ for mounted devices within bom importer
[IVM-1827] – Total line in estimated coverage report
[IVM-1918] – Improve default ca9 export name
[IVM-1940] – RepairView should have a scroll bars for small screens


Release Notes – Version 3.16 – 22.04.2016

New Features

[IVM-1392] – Ca9: PCB size command
[IVM-1854] – Ca9: File export for double side (Beta)

Improvements

[IVM-1228] – Editable Combobox
[IVM-1677] – Delete gate value
[IVM-1778] – Repair View: Show Order number
[IVM-1821] – Net test should be aware of NetLink
[IVM-1848] – Change mounted state within cad viewer
[IVM-1858] – Centi is no viable magnitude for all electrical units
[IVM-1859] – Zoom needs to view more than one device
[IVM-1906] – Recalculate standard tests creates many Result view reset events
[IVM-1930] – Repair View: Searching for tickets is accepting wildcards


Release Notes – Version 3.15 – 29.02.2016

New Features

[IVM-1691] – Manual adding testpoints
[IVM-1842] – Table containing project device summary within meta data view

Improvements

[IVM-1575] – Disable delete button if group can’t be deleted
[IVM-1632] – Cancel setup if db update hasn’t been successful
[IVM-1659] – Use other bounding polygon algrithmus, if first calculation failed
[IVM-1726] – Test Overview: After creating test, show new test immediately in detail view
[IVM-1741] – Package view: „Regenerate bounding box“ combo is empty
[IVM-1772] – Global repair states
[IVM-1773] – Select possible repair states in project
[IVM-1776] – Repair View: Show All Net Button
[IVM-1777] – Show Repair View only if project data available
[IVM-1779] – Merlin Repair: Table View
[IVM-1797] – Create bde folders
[IVM-1798] – Merlin Repair: Progress on load serial number button
[IVM-1802] – Performance: Faster loading of testheaders for repairview selection
[IVM-1816] – Client and server are not compatible is not showing up in log file
[IVM-1852] – Result view: Remove not needed type column from device tests


Release Notes – Version 3.14 – Jan 2016

New Features

[IVM-1728] – New Merlin Repair product
[IVM-1304] – Test gates which are connected to NoneNet
[IVM-1393] – Highlight two net with different color each
[IVM-1601] – New Library View

Improvements

[IVM-1596] – Smart IC: Separate Tolerance input field for Pin To Ground and IC Open
[IVM-1646] – Support @CP of IC Open command
[IVM-1633] – @VO Command only on mounted thd pads
[IVM-1729] – Improve heuristic to get better accesspoint at Corners
[IVM-1746] – Device List default sort column missed
[IVM-1764] – improved perfomance of „Recalculate standard tests“ and open of result view
[IVM-1643] – New View to show exported CA9
[IVM-618]  – unify Gate / Device / Net Test Template dialog
[IVM-1148] – FATF Importer with a more tolerant string for pin naming
[IVM-1245] – Separate THD and Via
[IVM-1435] – Wrong zoom level in PackageView
[IVM-1514] – Read pin name to improve gate case mapping
[IVM-1557] – Show accumulated level within library mapping view.
[IVM-1577] – Support library mapping for bom only without cad.
[IVM-1592] – Redesign of „Edit Filter“ dialog
[IVM-1595] – CadViewer: Disallow accesspoints color is not visible due to selection color
[IVM-1602] – Merlin Explorer: Library Mappings View „Set as default“ function
[IVM-1636] – Revert device aware accesspoint algorithm
[IVM-1678] – Improve Filter of Link to Library Dialog
[IVM-1687] – Mouse scroll shouldn’t change Gatetype / Subtype
[IVM-1690] – Entering package height is not possible with magnitude
[IVM-1733] – Pad based bounding box algorithm needs to overlap the complete thd
[IVM-1738] – Show package height within in cad details
[IVM-1745] – Remove different open commands for library mapping view


Release Notes – Version 3.13 – Nov 2015

New Features

[IVM-1682] – Crystal gate type
[IVM-1304] – Test gates which are connected to NoneNet
[IVM-1169] – A new net type to support more than one net with pins unconnected
[IVM-1556] – Use electrical net for accessing tests

Improvements

[IVM-897] – Shortcuts for CAD Viewer
[IVM-1038] – Automatically set assembly and/or package as processed for library objects
[IVM-1389] – Line break in Ca9
[IVM-1423] – Device View: Order of SubType Combo items
[IVM-1563] – Improved filtering of boolean columns in data tables
[IVM-1564] – Labelling of grouped items
[IVM-1573] – Add serial capacitor to cluster recognation
[IVM-1641] – Wrong names within grouping dialog
[IVM-1681] – Editing the table configurations is forcing the view as dirty


Release Notes – Version 3.12 – Oct 2015

New Features

[IVM-218]  – Save APT9411 export within Project
[IVM-1553] – Add new GateType – NetLink
[IVM-1555] – Cluster calculation based on electrical net
[IVM-1479] – Add test condition for a materialnumber
[IVM-1518] – Extend cad viewer search with test Points
[IVM-1658] – Add accesspoint informations to estimated coverage Report

Improvements

[IVM-1657] – Improve performance of net distance calculation
[IVM-1511] – Improve performance of Result View open and Recalculate Standard Tests
[IVM-1126] – Move ‚Force Lock Release‘ down of the context menu
[IVM-1224] – Provide possibility to enter a measuring time in the pin to ground command
[IVM-1254] – Do not create a Test with MISSING_GATE for Mechanical
[IVM-1326] – Same icons for bottom flip in CAD Viewer and TestResult View
[IVM-1456] – Some tasks are only usefull, if CA9 node is available
[IVM-1489] – Merlin Explorer: Double click on „Library Mappings“ should open view
[IVM-1492] – DoNotTestCommand for ignored PinToPin Tests
[IVM-1495] – New ICOpen automatic generation warning, if ground is on wrong side
[IVM-1496] – Create task only if usefull setting has changed
[IVM-1501] – Don’t export or even create Tests for Fiducials
[IVM-1502] – Remove redundant setting „Use only test points as access points“ (BC)
[IVM-1533] – Some Colums can not be sorted
[IVM-1538] – Multiselect and Delete in Test Configuration
[IVM-1542] – Warn, if project status changed
[IVM-1605] – Remove „No pin available“ of Smart IC Test
[IVM-1612] – Improve usability of editing gate connectors
[IVM-1614] – Change Text „Minimum diameter of VIA holes to be considered (µm):“
[IVM-1615] – Change text „Prefer Test Points“
[IVM-1618] – Remove power net from IC Open Tests of SmartIC tests
[IVM-1654] – Redundancy Checker: create always the same redundant tests
[IVM-1663] – Result View may contain duplicted Messages


Release Notes – Version 3.11.2 – Sep 2015

Improvements

[IVM-1657] – Improved performance of net distance calculation


Release Notes – Version 3.11.1 – Sep 2015

Improvements

[IVM-1618] – Remove power net from IC Open Tests of Smart IC tests


Release Notes – Version 3.11 – Sep 2015

New Features

[IVM-1546] – Remove Pin To Ground Test if power net
[IVM-1547] – IC Open Test test all valid pins now (not only pins at bus net)
[IVM-1409] – Redundancy Checker for Pin To Pin and Pin To Ground
[IVM-792] – New Smart IC Test
[IVM-604] – Searching and Grouping in tables
[IVM-945] – Measuring of distances in CAD Viewer
[IVM-302] – Parse Gate Subtypes im Partlist Importer
[IVM-589] – Change Project State (In Progress, Productive, Archived)

Improvements

[IVM-1295] – Cad Import timeout textfields are too small
[IVM-1344] – CAD Viewer: Add message if search object doesn’t contain any image parts
[IVM-1408] – Extend existing Redundant Checker for Indurance and Voltage
[IVM-1427] – Add multiselect to library mappings view
[IVM-1429] – The redundant test should be the one with the jump flag
[IVM-1446] – Accesspoints should be placed far away from the device
[IVM-1458] – Remove negative sign for gate test value
[IVM-1465] – Project settings/Board Colors: in selected row the color is invisible
[IVM-1470] – Estimated Coverage Document: Export accesspoint and assgined number into XML document
[IVM-1453] – Estimated Coverage Document: Net Overview table for html document
[IVM-1454] – Estimated Coverage Document: Open Browser after html document was created


Release Notes – Version 3.10.1 – Jul 2015

Improvements

[IVM-1490] – Support license production by USB


Release Notes – Version 3.10 – Jul 2015

Improvements

[IVM-711] – Rotation should be shown in CadViewer properties on selection
[IVM-910] – Java geom library als OSGi plug-in anbieten / Line-Intersection Fehler
[IVM-1173] – CAD viewer properties: in selected row is color invisible
[IVM-1230] – Login Exception with Java jdk1.7.0_75
[IVM-1236] – Bom Importer: Preview field should be based on the complete result
[IVM-1250] – Add ESC for editing bounding box
[IVM-1297] – Opening Project Dialog – Cancel not work
[IVM-1310] – DeviceView: Open window to edit a device by double click
[IVM-1311] – Open window to edit a test template by double click
[IVM-1312] – Allow „show in schematic“ from DeviceView
[IVM-1345] – Remove Fiducials from Test Overview
[IVM-1380] – Function to delete pdf import
[IVM-1407] – Jumped flag is not valid in case of transistor test
[IVM-1447] – Main toolbar items are displaced in toolbar
[IVM-1452] – Improve Layout of html Estimated Report


Release Notes – Version 3.9 – 12. Jun 2015

New Features

[IVM-1052] – Show assigned devices to a given package within the package view
[IVM-1278] – Create html coverage document
[IVM-1283] – Add new administration user
[IVM-1292] – increase setup usability

Improvements

[IVM-754] – CA9 file organizes Pads by size
[IVM-1097] – Save offset for package only library data
[IVM-1206] – alphabetical order of the merlin tree
[IVM-1217] – For multigated devices information about the gate must be in the CA9
[IVM-1242] – Verify auxiliary and null reference is not reliable yet
[IVM-1257] – No subcommand in result view
[IVM-1258] – Warning dialog about net distance calculation shown although already calculated
[IVM-1272] – PinToPin test not neighbor pins
[IVM-1277] – Cluster value in ca9 should be set as reference value
[IVM-1279] – Paint holes in cad
[IVM-1287] – HighFlyZone Recalculation only when necessary
[IVM-1309] – Rewrite message dialogs
[IVM-1348] – Improved neighbor calculation for PinToPin test
[IVM-1349] – Configure comment field for tests
[IVM-1362] – Add information dialog if project isn’t possible to import because of newer Version


Release Notes – Version 3.8 – 30. Apr 2015

New Features

[IVM-1042] – No contact zone
[IVM-1115] – Export a simple test coverage document

Improvements

[IVM-746] – Changed Net to Net comment field
[IVM-1011] – Database update mechanism triggerd by merlin server
[IVM-1086] – Improve editing of bounding boxes
[IVM-1102] – Change symbol of NullReference and AUX
[IVM-1118] – Automatic zoom to selected parts in schematic
[IVM-1132] – Change error message if save failed
[IVM-1134] – Range condition with minimun version set
[IVM-1146] – Bom Import: Use materialnumber to define gate subtype
[IVM-1155] – Cross to manipulate bounding box should be related to zoom level
[IVM-1156] – Automatically reduce interiorbox if bounding box got changed
[IVM-1163] – Show warning if project is locked by export
[IVM-1194] – Show bounding box instead of package in result view
[IVM-1216] – Small access points are difficult to see
[IVM-1240] – Ignore accesspoint disc with inner radius larger than 2500µm
[IVM-1260] – Speed up performance in calculating net distances
[IVM-1265] – CADViewer (CAD Data) should not show additional information


Release Notes – Version 3.7 – 7. Apr 2015

New Features

[IVM-588] – Repair Station ( Not released yet )
[IVM-1130] – Task View
[IVM-1170] – Disable/Enable not mounted devices within cad viewer

Improvements

[IVM-946] – Use diameter instead of radius
[IVM-995] – Save rotation, mirror and testside in test result view
[IVM-1015] – Improve color balance within assembly view
[IVM-1018] – Optimize performance for ImageContainerQuery
[IVM-1119] – Test Point number won’t be preferred for ca9 export
[IVM-1137] – Automatic enable of virtual test point layer
[IVM-1178] – Order of GatePinMapping is changing
[IVM-1195] – Add context dialog to create template test within test result view
[IVM-1203] – Automatic naming during export / import
[IVM-1205] – Packaging multiple files to zip for CAD import
[IVM-1213] – Fiducials and Testpoint are always mounted
[IVM-1218] – Test specification is showing class name
[IVM-1226] – Default unit of package height should be mm
[IVM-1234] – Update PDF Library to Version 2.17


Release Notes – Version 3.6 – 2. März 2015

New Features

[IVM-433] – Templates for untestable devices or gates
[IVM-603] – Integration pdf view for schematics (additional module)
[IVM-765] – Convert devices to fiducials
[IVM-840] – Create automatically Fiducial and AUX_1
[IVM-1021] – Send error message via mail.
[IVM-1033] – Vision test for clusters
[IVM-1034] – Check client version compatiblity
[IVM-1074] – Repair View (beta)
[IVM-1079] – Change user password on client side

Improvements

[IVM-315] – Change Partlist filter order
[IVM-420] – Disable „Create Gate Tests“ menu item, if no gates available
[IVM-510] – Always generate the same access points number
[IVM-753] – Unmounted pads will be exported as Pad_NM
[IVM-875] – Transparency in CADViewer for bounding boxes and nmounted  devices
[IVM-1019] – Improve adding a new gate pin mapping within assembly view
[IVM-1023] – Improve rule when to show a warning signal for a gate pin mapping
[IVM-1024] – Use the nearly the same coordinates if only one accesspoint is available for kelvin test
[IVM-1035] – ICopen test just on pins on bus or on pins connected to a diode
[IVM-1047] – Template range for not defined needs to be more unambiguously (No value condition)
[IVM-1058] – Add device selection within test result view
[IVM-1075] – Color of CADViewer
[IVM-1087] – Menu help entry needs to be on the right side
[IVM-1092] – Takaya is interpreting mO (milliohm) as MO (megaohm)
[IVM-1099] – Adding device test in overview is valid for all assemblies
[IVM-1107] – Calculate access points on vertical and horizontal oblongs


Release Notes – Version 3.5 – 4. Feb 2015

New Features

[IVM-739] – Deleteing duplicate measurements
[IVM-744] – Redundant vision tests due to clusters should be ignored
[IVM-1002] – Set preferred test side in project manager settings
[IVM-1004] – Export and import complete projects
[IVM-1005] – Extended Reference-Dialog to choose subtypes for specific references
[IVM-1063] – Write PartsPositionCommand to CA9

Improvements

[IVM-298] – Layer information should be kept when deleting partlist or CAD data only
[IVM-358] – GC Mapping should show Pin Names
[IVM-509] – Delete duplicate net tests
[IVM-573] – Remove DevTypeContainer because is equal to AsmTypeContainer
[IVM-652] – Update TestResultView Table
[IVM-732] – Graph Service API erstellen
[IVM-823] – Performance impact by deleting NetParts
[IVM-891] – Keep column size in BOM importer when changing mappings
[IVM-922] – Progress display when changing top/bottom/both in result view
[IVM-940] – Comboboxes in reference editing too small
[IVM-947] – GUI is not responding when CAD data gets deleted
[IVM-978] – BOM Import should also create Mechanical assemblies
[IVM-983] – Loading tests is too slow
[IVM-985] – Export naming for parallel / seriell Cs und Rs
[IVM-997] – BOM Import references cannot be reset to empty
[IVM-1008] – No automatic UNUSED pins in ICs
[IVM-1009] – Move BOM Importer Settings zu Settings-Tree
[IVM-1039] – Remove „Export Assembly“ menu entry
[IVM-1041] – Add setting to define minimum package height for highfly zone
[IVM-1055] – When adding a new gate subtype can already be defined
[IVM-1068] – Redundance check is not canceled when closing TestResultView
[IVM-1069] – TestResultView is refreshed when opening assembly or package
[IVM-1071] – Additional contents automatically added to setup


Release Notes – Version 3.4 – 19. Dez 2014

New Features

Support clusters for resistance and conductors
[IVM-159] – Add cluster structure
[IVM-637] – Automatic calculation of clusters
[IVM-785] – Add template condition for clusters
[IVM-786] – Create test based on a template cluster test
[IVM-943] – Extend Test Result View with a new cluster tab
[IVM-949] – Save and load clusters
[IVM-950] – New Action menu to calculate clusters

Misc

[IVM-082] – New way to set magnitude and unit for all gates
[IVM-851] – Activate new Welcome-Page
[IVM-957] – Installation without Internet connection
[IVM-958] – New settings page for access points

Improvements

[IVM-541] – BOM-Importer: Set device reference based on material number
[IVM-795] – Keep CA9-Settings after removing CA9-Testing node
[IVM-822] – Added net an pin connection to edit assembly view
[IVM-886] – „Not mounted“-Condition needs to be available for gate template tests, too
[IVM-953] – Show package dimension in [mm]
[IVM-967] – New icons for TOP and BOT within TestResultView
[IVM-968] – Optimize Track, Circle and Polygon painting
[IVM-969] – Use center for access points on test points


Release Notes – Version 3.3 – 21. Nov 2014

New Features

[IVM-170] – User authentication
[IVM-866] – Support for virtual test points

Improvements

[IVM-613] – Replaces FilebasedServices with MySQL Database
[IVM-715] – Add „Missing Gate“ type for template tests
[IVM-775] – Show umounted devices in another colour within cad viewer
[IVM-837] – BOM-Import supports SAP files
[IVM-870] – Support for gate sub types within device test templates
[IVM-902] – Import VIAs based on devices within CAD data
[IVM-905] – CA9 export sorting pins
[IVM-909] – CA9 export support for @SR command
[IVM-430] – Mechanical devices