Merlin release history

INTERVITIS INTERFRUCTA HORTITechnica

Visit us at the fair for technology for wine, fruit juice and special crops in Stuttgart from from 4th to the 6th of November. You will find us in Hall 10 Stand 10 / E59

EIMA International

Visit us from the 7th to the 11th of November at the International Exhibition of Agricultural Machinery and Horticulture in Bologna. You will find us in hall 30 booth D/3

Interpoma

We will be exhibiting at the Interpoma, the international exhibition for the cultivation, storage and marketing of the apple, in Bolzano, from 15th to 17th of November. You will find us on booth C18 / 64

Merlin release – Version 3.31

In addition to the elimination of minor errors, the new version 3.31 again includes a variety of new features and improvements.
+ An ASCII export has been integrated for VISCOM (extra license required)
+ Via the BOM import sub types of gates can now be assigned directly.
+ Improved algorithm for automatic calculation of bounding boxes
+ In the network pin assignment, the test points are now directly visible

The ‘CleverSpray’ app goes into production at inovel

Report of the project transfer of the Worms University of Applied Sciences to inovel.
(das deutsche weinmagazin – 25. August 2018)

Report as PDF

With ‘BigApple’ to less bearing losses

Report of the joint project ‘BigApple’.
(Obstzeitschrift POMA August 2018)

Report as PDF

CleverSpray – University of Worms

The series product CleverSpray, control unit with App for plant protection equipment (special cultures) was presented to the press at the University of Worms.

The pre-development of the Wine-Growing App was started by the Worms University (Prof. Dr. Ruhland) in coorperation with winemaker Richard Grünewald in 2014.
Picture by Eva Grünewald

Hybridmodem development with Telespazio VEGA Deutschland GmbH

Report on Hybrid Development with Telespazio VEGA Deutschland GmbH.
(ECHO ONLINE / ECONOMY / ECONOMY SOUTH HESSEN)

report as PDF (German)

Smart- and CleverSpray at Technology Day in Krasnodar (Russia)

Presentation of Smart- and CleverSpray at Technology Day in Krasnodar Russia.
More than 120 guests followed the interesting lectures. There were more than 80 companies representing a total of 25,000 ha of fruit cultivation.

SmartSpray in Kazakhstan

First machine equipped with SmartSpray in Kazakhstan.

Release Notes – Version 3.24 – 07.04.2017

New Features

[IVM-2305] – New Accesspoint View

Improvements

[IVM-2286] – Performance: Pin Number build improve so export for larger project is a lot faster
[IVM-2303] – Support rectangle with hole THD areas for automatic accespoint calculation
[IVM-2309] – CAD-Viewer: Show search result first within currently selected side
[IVM-2314] – Coverage Report: add new test table
[IVM-2315] – Coverage Report: split reports into individual html pages
[IVM-2359] – New context menu within NetView to show electrical net


Release Notes – Version 3.23 – 03.03.2017

New Features

[IVM-2159] – Parse additional exported files from Siemens importer

Improvements

[IVM-1782] – Cluster detail view
[IVM-2155] – Merlin repair: Add filter for project repair index.
[IVM-2232] – Pin-Pin-Mapping should be editable in Library-Mapping
[IVM-2289] – Remove gate error from “Select library device for mapping” dialog
[IVM-2307] – Overall performance improvements for Merlin
[IVM-2316] – Merlin Repair: support several xml versions


Release Notes – Version 3.21 – 18.10.2016

New Features

[IVM-552] – Logging Level configuration in new preferences dialog

Improvements

[IVM-2081] – Reverse measurement for IC´s
[IVM-2100] – Handle devices without coordinates.
[IVM-2185] – Updated Siemens-Importer for Zuken and ODB


Release Notes – Version 3.20 – 12.09.2016

New Features

[IVM-1752] – Link devices between different views
[IVM-1931] – NO and NC as new GateSubType for Relay

Improvements

[IVM-2060] – Allow selection of exporter when export is triggered by task view and multiple exporters are available
[IVM-2115] – Search for device in Cluster View
[IVM-2138] – Improve performance for opening Test Result View


Release Notes – Version 3.19 – 28.07.2016

New Features

[IVM-2022] – Link ATD und XML files to merlin project

Improvements

[IVM-1781] – New group element to see all electrical net
[IVM-1828] – Change startmenu entry
[IVM-1830] – It should be possible to edit description and condition after test template has been created again
[IVM-1840] – Repair: Access net shares for collecting / storing files
[IVM-1936] – Library Mapping wrong initial state for known library entry
[IVM-1965] – Device View: Improve default NetLink pin Connections
[IVM-1981] – Disable merlin repair merlin explorer functions
[IVM-1995] – Repair: Arrow left and right shortcut for step actions
[IVM-2006] – Better calculation of access points on pads
[IVM-2011] – Probe Permissions on bottom improved
[IVM-2015] – Sync should only be active if project data are present
[IVM-2020] – Repair: Improve net distances algorithm for close net
[IVM-2056] – Possible needle calculation: mirroring should be taken into account


Release Notes – Version 3.18 – 27.06.2016

New Features

[IVM-1923] – Resize bounding box with a single mouse move action
[IVM-1947] – Repair: Show Open Test problems with a simple red circle
[IVM-1976] – Repair: Judgement filter list

Improvements

[IVM-1744] – FETGeneration and TransistorGenerationTest are supporting jumped flag
[IVM-1868] – Repair: Show test comment within repair view
[IVM-1871] – Merlin repair and Merlin pro blocks projects for the other programm
[IVM-1873] – Repair: Improve serial number search
[IVM-1973] – Repair: Closing repair view will close project
[IVM-1975] – Repair: Auto highlight net for each test switch
[IVM-1979] – Repair: Only show pin lables used for the current test
[IVM-2009] – Net Distance Calculation: save all net distances < 1,5mm and not < 0,5mm


Release Notes – Version 3.17 – 23.05.2016

New Features

[IVM-1925] – Takaya 9600 flying probe tester support (double side export)
[IVM-1958] – Added Cluster Tests to estimated coverage report

Improvements

[IVM-1167] – Use keyword “yes” instead of “x” for mounted devices within bom importer
[IVM-1827] – Total line in estimated coverage report
[IVM-1918] – Improve default ca9 export name
[IVM-1940] – RepairView should have a scroll bars for small screens


Release Notes – Version 3.16 – 22.04.2016

New Features

[IVM-1392] – Ca9: PCB size command
[IVM-1854] – Ca9: File export for double side (Beta)

Improvements

[IVM-1228] – Editable Combobox
[IVM-1677] – Delete gate value
[IVM-1778] – Repair View: Show Order number
[IVM-1821] – Net test should be aware of NetLink
[IVM-1848] – Change mounted state within cad viewer
[IVM-1858] – Centi is no viable magnitude for all electrical units
[IVM-1859] – Zoom needs to view more than one device
[IVM-1906] – Recalculate standard tests creates many Result view reset events
[IVM-1930] – Repair View: Searching for tickets is accepting wildcards


Release Notes – Version 3.15 – 29.02.2016

New Features

[IVM-1691] – Manual adding testpoints
[IVM-1842] – Table containing project device summary within meta data view

Improvements

[IVM-1575] – Disable delete button if group can’t be deleted
[IVM-1632] – Cancel setup if db update hasn’t been successful
[IVM-1659] – Use other bounding polygon algrithmus, if first calculation failed
[IVM-1726] – Test Overview: After creating test, show new test immediately in detail view
[IVM-1741] – Package view: “Regenerate bounding box” combo is empty
[IVM-1772] – Global repair states
[IVM-1773] – Select possible repair states in project
[IVM-1776] – Repair View: Show All Net Button
[IVM-1777] – Show Repair View only if project data available
[IVM-1779] – Merlin Repair: Table View
[IVM-1797] – Create bde folders
[IVM-1798] – Merlin Repair: Progress on load serial number button
[IVM-1802] – Performance: Faster loading of testheaders for repairview selection
[IVM-1816] – Client and server are not compatible is not showing up in log file
[IVM-1852] – Result view: Remove not needed type column from device tests


Release Notes – Version 3.14 – Jan 2016

New Features

[IVM-1728] – New Merlin Repair product
[IVM-1304] – Test gates which are connected to NoneNet
[IVM-1393] – Highlight two net with different color each
[IVM-1601] – New Library View

Improvements

[IVM-1596] – Smart IC: Separate Tolerance input field for Pin To Ground and IC Open
[IVM-1646] – Support @CP of IC Open command
[IVM-1633] – @VO Command only on mounted thd pads
[IVM-1729] – Improve heuristic to get better accesspoint at Corners
[IVM-1746] – Device List default sort column missed
[IVM-1764] – improved perfomance of “Recalculate standard tests” and open of result view
[IVM-1643] – New View to show exported CA9
[IVM-618]  – unify Gate / Device / Net Test Template dialog
[IVM-1148] – FATF Importer with a more tolerant string for pin naming
[IVM-1245] – Separate THD and Via
[IVM-1435] – Wrong zoom level in PackageView
[IVM-1514] – Read pin name to improve gate case mapping
[IVM-1557] – Show accumulated level within library mapping view.
[IVM-1577] – Support library mapping for bom only without cad.
[IVM-1592] – Redesign of “Edit Filter” dialog
[IVM-1595] – CadViewer: Disallow accesspoints color is not visible due to selection color
[IVM-1602] – Merlin Explorer: Library Mappings View “Set as default” function
[IVM-1636] – Revert device aware accesspoint algorithm
[IVM-1678] – Improve Filter of Link to Library Dialog
[IVM-1687] – Mouse scroll shouldn’t change Gatetype / Subtype
[IVM-1690] – Entering package height is not possible with magnitude
[IVM-1733] – Pad based bounding box algorithm needs to overlap the complete thd
[IVM-1738] – Show package height within in cad details
[IVM-1745] – Remove different open commands for library mapping view


Release Notes – Version 3.13 – Nov 2015

New Features

[IVM-1682] – Crystal gate type
[IVM-1304] – Test gates which are connected to NoneNet
[IVM-1169] – A new net type to support more than one net with pins unconnected
[IVM-1556] – Use electrical net for accessing tests

Improvements

[IVM-897] – Shortcuts for CAD Viewer
[IVM-1038] – Automatically set assembly and/or package as processed for library objects
[IVM-1389] – Line break in Ca9
[IVM-1423] – Device View: Order of SubType Combo items
[IVM-1563] – Improved filtering of boolean columns in data tables
[IVM-1564] – Labelling of grouped items
[IVM-1573] – Add serial capacitor to cluster recognation
[IVM-1641] – Wrong names within grouping dialog
[IVM-1681] – Editing the table configurations is forcing the view as dirty


Release Notes – Version 3.12 – Oct 2015

New Features

[IVM-218]  – Save APT9411 export within Project
[IVM-1553] – Add new GateType – NetLink
[IVM-1555] – Cluster calculation based on electrical net
[IVM-1479] – Add test condition for a materialnumber
[IVM-1518] – Extend cad viewer search with test Points
[IVM-1658] – Add accesspoint informations to estimated coverage Report

Improvements

[IVM-1657] – Improve performance of net distance calculation
[IVM-1511] – Improve performance of Result View open and Recalculate Standard Tests
[IVM-1126] – Move ‘Force Lock Release’ down of the context menu
[IVM-1224] – Provide possibility to enter a measuring time in the pin to ground command
[IVM-1254] – Do not create a Test with MISSING_GATE for Mechanical
[IVM-1326] – Same icons for bottom flip in CAD Viewer and TestResult View
[IVM-1456] – Some tasks are only usefull, if CA9 node is available
[IVM-1489] – Merlin Explorer: Double click on “Library Mappings” should open view
[IVM-1492] – DoNotTestCommand for ignored PinToPin Tests
[IVM-1495] – New ICOpen automatic generation warning, if ground is on wrong side
[IVM-1496] – Create task only if usefull setting has changed
[IVM-1501] – Don’t export or even create Tests for Fiducials
[IVM-1502] – Remove redundant setting “Use only test points as access points” (BC)
[IVM-1533] – Some Colums can not be sorted
[IVM-1538] – Multiselect and Delete in Test Configuration
[IVM-1542] – Warn, if project status changed
[IVM-1605] – Remove “No pin available” of Smart IC Test
[IVM-1612] – Improve usability of editing gate connectors
[IVM-1614] – Change Text “Minimum diameter of VIA holes to be considered (µm):”
[IVM-1615] – Change text “Prefer Test Points”
[IVM-1618] – Remove power net from IC Open Tests of SmartIC tests
[IVM-1654] – Redundancy Checker: create always the same redundant tests
[IVM-1663] – Result View may contain duplicted Messages


Release Notes – Version 3.11.2 – Sep 2015

Improvements

[IVM-1657] – Improved performance of net distance calculation


Release Notes – Version 3.11.1 – Sep 2015

Improvements

[IVM-1618] – Remove power net from IC Open Tests of Smart IC tests


Release Notes – Version 3.11 – Sep 2015

New Features

[IVM-1546] – Remove Pin To Ground Test if power net
[IVM-1547] – IC Open Test test all valid pins now (not only pins at bus net)
[IVM-1409] – Redundancy Checker for Pin To Pin and Pin To Ground
[IVM-792] – New Smart IC Test
[IVM-604] – Searching and Grouping in tables
[IVM-945] – Measuring of distances in CAD Viewer
[IVM-302] – Parse Gate Subtypes im Partlist Importer
[IVM-589] – Change Project State (In Progress, Productive, Archived)

Improvements

[IVM-1295] – Cad Import timeout textfields are too small
[IVM-1344] – CAD Viewer: Add message if search object doesn’t contain any image parts
[IVM-1408] – Extend existing Redundant Checker for Indurance and Voltage
[IVM-1427] – Add multiselect to library mappings view
[IVM-1429] – The redundant test should be the one with the jump flag
[IVM-1446] – Accesspoints should be placed far away from the device
[IVM-1458] – Remove negative sign for gate test value
[IVM-1465] – Project settings/Board Colors: in selected row the color is invisible
[IVM-1470] – Estimated Coverage Document: Export accesspoint and assgined number into XML document
[IVM-1453] – Estimated Coverage Document: Net Overview table for html document
[IVM-1454] – Estimated Coverage Document: Open Browser after html document was created


Release Notes – Version 3.10.1 – Jul 2015

Improvements

[IVM-1490] – Support license production by USB


Release Notes – Version 3.10 – Jul 2015

Improvements

[IVM-711] – Rotation should be shown in CadViewer properties on selection
[IVM-910] – Java geom library als OSGi plug-in anbieten / Line-Intersection Fehler
[IVM-1173] – CAD viewer properties: in selected row is color invisible
[IVM-1230] – Login Exception with Java jdk1.7.0_75
[IVM-1236] – Bom Importer: Preview field should be based on the complete result
[IVM-1250] – Add ESC for editing bounding box
[IVM-1297] – Opening Project Dialog – Cancel not work
[IVM-1310] – DeviceView: Open window to edit a device by double click
[IVM-1311] – Open window to edit a test template by double click
[IVM-1312] – Allow “show in schematic” from DeviceView
[IVM-1345] – Remove Fiducials from Test Overview
[IVM-1380] – Function to delete pdf import
[IVM-1407] – Jumped flag is not valid in case of transistor test
[IVM-1447] – Main toolbar items are displaced in toolbar
[IVM-1452] – Improve Layout of html Estimated Report


Release Notes – Version 3.9 – 12. Jun 2015

New Features

[IVM-1052] – Show assigned devices to a given package within the package view
[IVM-1278] – Create html coverage document
[IVM-1283] – Add new administration user
[IVM-1292] – increase setup usability

Improvements

[IVM-754] – CA9 file organizes Pads by size
[IVM-1097] – Save offset for package only library data
[IVM-1206] – alphabetical order of the merlin tree
[IVM-1217] – For multigated devices information about the gate must be in the CA9
[IVM-1242] – Verify auxiliary and null reference is not reliable yet
[IVM-1257] – No subcommand in result view
[IVM-1258] – Warning dialog about net distance calculation shown although already calculated
[IVM-1272] – PinToPin test not neighbor pins
[IVM-1277] – Cluster value in ca9 should be set as reference value
[IVM-1279] – Paint holes in cad
[IVM-1287] – HighFlyZone Recalculation only when necessary
[IVM-1309] – Rewrite message dialogs
[IVM-1348] – Improved neighbor calculation for PinToPin test
[IVM-1349] – Configure comment field for tests
[IVM-1362] – Add information dialog if project isn’t possible to import because of newer Version


Release Notes – Version 3.8 – 30. Apr 2015

New Features

[IVM-1042] – No contact zone
[IVM-1115] – Export a simple test coverage document

Improvements

[IVM-746] – Changed Net to Net comment field
[IVM-1011] – Database update mechanism triggerd by merlin server
[IVM-1086] – Improve editing of bounding boxes
[IVM-1102] – Change symbol of NullReference and AUX
[IVM-1118] – Automatic zoom to selected parts in schematic
[IVM-1132] – Change error message if save failed
[IVM-1134] – Range condition with minimun version set
[IVM-1146] – Bom Import: Use materialnumber to define gate subtype
[IVM-1155] – Cross to manipulate bounding box should be related to zoom level
[IVM-1156] – Automatically reduce interiorbox if bounding box got changed
[IVM-1163] – Show warning if project is locked by export
[IVM-1194] – Show bounding box instead of package in result view
[IVM-1216] – Small access points are difficult to see
[IVM-1240] – Ignore accesspoint disc with inner radius larger than 2500µm
[IVM-1260] – Speed up performance in calculating net distances
[IVM-1265] – CADViewer (CAD Data) should not show additional information


Release Notes – Version 3.7 – 7. Apr 2015

New Features

[IVM-588] – Repair Station ( Not released yet )
[IVM-1130] – Task View
[IVM-1170] – Disable/Enable not mounted devices within cad viewer

Improvements

[IVM-946] – Use diameter instead of radius
[IVM-995] – Save rotation, mirror and testside in test result view
[IVM-1015] – Improve color balance within assembly view
[IVM-1018] – Optimize performance for ImageContainerQuery
[IVM-1119] – Test Point number won’t be preferred for ca9 export
[IVM-1137] – Automatic enable of virtual test point layer
[IVM-1178] – Order of GatePinMapping is changing
[IVM-1195] – Add context dialog to create template test within test result view
[IVM-1203] – Automatic naming during export / import
[IVM-1205] – Packaging multiple files to zip for CAD import
[IVM-1213] – Fiducials and Testpoint are always mounted
[IVM-1218] – Test specification is showing class name
[IVM-1226] – Default unit of package height should be mm
[IVM-1234] – Update PDF Library to Version 2.17


Release Notes – Version 3.6 – 2. März 2015

New Features

[IVM-433] – Templates for untestable devices or gates
[IVM-603] – Integration pdf view for schematics (additional module)
[IVM-765] – Convert devices to fiducials
[IVM-840] – Create automatically Fiducial and AUX_1
[IVM-1021] – Send error message via mail.
[IVM-1033] – Vision test for clusters
[IVM-1034] – Check client version compatiblity
[IVM-1074] – Repair View (beta)
[IVM-1079] – Change user password on client side

Improvements

[IVM-315] – Change Partlist filter order
[IVM-420] – Disable “Create Gate Tests” menu item, if no gates available
[IVM-510] – Always generate the same access points number
[IVM-753] – Unmounted pads will be exported as Pad_NM
[IVM-875] – Transparency in CADViewer for bounding boxes and nmounted  devices
[IVM-1019] – Improve adding a new gate pin mapping within assembly view
[IVM-1023] – Improve rule when to show a warning signal for a gate pin mapping
[IVM-1024] – Use the nearly the same coordinates if only one accesspoint is available for kelvin test
[IVM-1035] – ICopen test just on pins on bus or on pins connected to a diode
[IVM-1047] – Template range for not defined needs to be more unambiguously (No value condition)
[IVM-1058] – Add device selection within test result view
[IVM-1075] – Color of CADViewer
[IVM-1087] – Menu help entry needs to be on the right side
[IVM-1092] – Takaya is interpreting mO (milliohm) as MO (megaohm)
[IVM-1099] – Adding device test in overview is valid for all assemblies
[IVM-1107] – Calculate access points on vertical and horizontal oblongs


Release Notes – Version 3.5 – 4. Feb 2015

New Features

[IVM-739] – Deleteing duplicate measurements
[IVM-744] – Redundant vision tests due to clusters should be ignored
[IVM-1002] – Set preferred test side in project manager settings
[IVM-1004] – Export and import complete projects
[IVM-1005] – Extended Reference-Dialog to choose subtypes for specific references
[IVM-1063] – Write PartsPositionCommand to CA9

Improvements

[IVM-298] – Layer information should be kept when deleting partlist or CAD data only
[IVM-358] – GC Mapping should show Pin Names
[IVM-509] – Delete duplicate net tests
[IVM-573] – Remove DevTypeContainer because is equal to AsmTypeContainer
[IVM-652] – Update TestResultView Table
[IVM-732] – Graph Service API erstellen
[IVM-823] – Performance impact by deleting NetParts
[IVM-891] – Keep column size in BOM importer when changing mappings
[IVM-922] – Progress display when changing top/bottom/both in result view
[IVM-940] – Comboboxes in reference editing too small
[IVM-947] – GUI is not responding when CAD data gets deleted
[IVM-978] – BOM Import should also create Mechanical assemblies
[IVM-983] – Loading tests is too slow
[IVM-985] – Export naming for parallel / seriell Cs und Rs
[IVM-997] – BOM Import references cannot be reset to empty
[IVM-1008] – No automatic UNUSED pins in ICs
[IVM-1009] – Move BOM Importer Settings zu Settings-Tree
[IVM-1039] – Remove “Export Assembly” menu entry
[IVM-1041] – Add setting to define minimum package height for highfly zone
[IVM-1055] – When adding a new gate subtype can already be defined
[IVM-1068] – Redundance check is not canceled when closing TestResultView
[IVM-1069] – TestResultView is refreshed when opening assembly or package
[IVM-1071] – Additional contents automatically added to setup


Release Notes – Version 3.4 – 19. Dez 2014

New Features

Support clusters for resistance and conductors
[IVM-159] – Add cluster structure
[IVM-637] – Automatic calculation of clusters
[IVM-785] – Add template condition for clusters
[IVM-786] – Create test based on a template cluster test
[IVM-943] – Extend Test Result View with a new cluster tab
[IVM-949] – Save and load clusters
[IVM-950] – New Action menu to calculate clusters

Misc

[IVM-082] – New way to set magnitude and unit for all gates
[IVM-851] – Activate new Welcome-Page
[IVM-957] – Installation without Internet connection
[IVM-958] – New settings page for access points

Improvements

[IVM-541] – BOM-Importer: Set device reference based on material number
[IVM-795] – Keep CA9-Settings after removing CA9-Testing node
[IVM-822] – Added net an pin connection to edit assembly view
[IVM-886] – “Not mounted”-Condition needs to be available for gate template tests, too
[IVM-953] – Show package dimension in [mm]
[IVM-967] – New icons for TOP and BOT within TestResultView
[IVM-968] – Optimize Track, Circle and Polygon painting
[IVM-969] – Use center for access points on test points


Release Notes – Version 3.3 – 21. Nov 2014

New Features

[IVM-170] – User authentication
[IVM-866] – Support for virtual test points

Improvements

[IVM-613] – Replaces FilebasedServices with MySQL Database
[IVM-715] – Add “Missing Gate” type for template tests
[IVM-775] – Show umounted devices in another colour within cad viewer
[IVM-837] – BOM-Import supports SAP files
[IVM-870] – Support for gate sub types within device test templates
[IVM-902] – Import VIAs based on devices within CAD data
[IVM-905] – CA9 export sorting pins
[IVM-909] – CA9 export support for @SR command
[IVM-430] – Mechanical devices